AUG 13, 2025

Drones and AI Revolutionize Corn Health Monitoring

WRITTEN BY: Laurence Tognetti, MSc

How can artificial intelligence (AI) and drones help boost corn yields? This is what a recent study published in Smart Agricultural Technology hopes to address as a team of researchers investigated novel techniques for monitoring corn field health, specifically regarding threats to crop chlorophyll, which is crucial for plant photosynthesis and requires nitrogen to function. This study has the potential to help farmers, legislators, and the public better understand new technologies for monitoring crop production and yield and the steps that can be taken to protect crops from environmental or human-caused threats.

For the study, the researchers used a combination of drones and AI to analyze chlorophyll data on a 0.2-hectare portion of a 14-hectare corn field near Colombia, Missouri. The goal of the study was to quantify nitrogen rates throughout the study area, which was measured at 115 meters (377 feet) by 60 meters (197 feet). After collecting the data via drones, the researchers used AI to estimate the nitrogen rates, discovering the AI demonstrated extreme accuracy in quantifying the amount of chlorophyll each plant contains.

“The goal of our lab is to use innovative technologies to improve the efficiency of agricultural systems,” said Dr. Jianfeng Zhou, who is an associate professor for agricultural engineering at the University of Missouri and a co-author on the study. “Nitrogen application has been one of the biggest challenges facing corn farmers. We want to help farmers increase their yields while using fewer chemicals that can impact the environment. Precision agriculture can help farmers apply nitrogen at the right time to the right location in the right amount.”

How will drones and AI help researchers and farmers improve crop yield management in the coming years and decades? Only time will tell, and this is why we science!

As always, keep doing science & keep looking up!

Sources: Smart Agricultural Technology, EurekAlert!

Featured Image: Study lead author, Fengkai Tian. (Credit: University of Missouri)