Cryogenic Electron Microscopy of Beam and Air-Sensitive Materials

Advances in cryogenic electron microscopy (cryo-EM), primarily driven by the life sciences, have emerged as powerful techniques for the characterization of beam and air sensitive materials. Cryo-EM avoids the drying artifacts introduced when preparing a sample for the high vacuum environment of an electron microscope, and significantly reduces e- beam damage. Therefore, materials can be imaged as close to their native hydrated (or solvated) state as possible, while avoiding unwanted transformations (e.g., oxidation). In this webinar we will discuss how cryo-EM is being used for the analysis of low-Z metals, biomimetic materials, polymers, nanocomposites, and their liquid-solid interfaces. We will present the workflow and logistics of using the Center for Integrated Nanotechnologies (CINTs) cryo-EM lab, in particular focused ion beam (FIB) lift out techniques and the unique challenges involved with performing this method at cryogenic temperatures.

 

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