SEP 09, 2021 11:00 AM PDT

Cryogenic Electron Microscopy of Beam and Air-Sensitive Materials

Sponsored by: Leica Microsystems

Event Date & Time
Date:  September 9, 2021
Time: 11:00am (PDT),  2:00pm (EDT)
Advances in cryogenic electron microscopy (cryo-EM), primarily driven by the life sciences, have emerged as powerful techniques for the characterization of beam and air sensitive materials. Cryo-EM avoids the drying artifacts introduced when preparing a sample for the high vacuum environment of an electron microscope, and significantly reduces e- beam damage. Therefore, materials can be imaged as close to their native hydrated (or solvated) state as possible, while avoiding unwanted transformations (e.g., oxidation). In this webinar we will discuss how cryo-EM is being used for the analysis of low-Z metals, biomimetic materials, polymers, nanocomposites, and their liquid-solid interfaces. We will present the workflow and logistics of using the Center for Integrated Nanotechnologies (CINTs) cryo-EM lab, in particular focused ion beam (FIB) lift out techniques and the unique challenges involved with performing this method at cryogenic temperatures.
Learning Objectives
  • Discuss how cryo-EM can provide unique characterization of materials as close to their native state as possible.
  • Outline the unique challenges of cryo-FIB, when compared to traditional room temperature lift-outs.
  • Demonstrate how the Leica cryo-EM workflow can combine characterization across multiple length scales.
Webinars will be available for unlimited on-demand viewing after live event.
LabRoots is approved as a provider of continuing education programs in the clinical laboratory sciences by the ASCLS P.A.C.E. ® Program. By attending this webinar, you can earn 1 Continuing Education credit once you have viewed the webinar in its entirety.

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